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Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System

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SKU:
52196
MPN:
XRF 940 V
Condition:
Used
Shipping:
Calculated at Checkout
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
  • Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System
$21,468.00
Was: $75,000.00

Description

Amtec XRF 940 V X-ray Fluorescence Coating Process Measuring System

From amtec Analysenmesstechnik GmbH:

XRF 940V: for measurement of coatings under vacuum conditions

Most popular related searches:
x-ray, fluorescence, radiation protection, corrosion protection, XRF, instrument temperature measuring, process measurement, radiation, control system, XRF measuring cooling water, radiation protection regulation

Measuring Tasks

  • Analysis of multiple layers, layer systems, alloy layers
  • Elements of the periodic system from (Na), Mg to U
  • Coating thickness range from nm to µm
  • Coating composition %, ‰

Applications

  • Solar cells such as CIS, CIGS, CdTe and others
  • Fuel cell
  • Corrosion protection
  • Contact layers
  • Magnetic layers
  • Barrier layers

Typical Properties Of The XRF 940V Instrument Family

  • Vacuum compatible measuring head for direct integration into the production line (in-situ)
  • Custom-designed configuration in order to guarantee optimal measurement results
  • Measuring period from 3s
  • Reproducibility of measurement results 1%, (depending on measurement duration)
  • Temperature of measurement objects up to 500°C
  • Compact water-cooled X-ray source
  • Silicon drift chamber detector for high energy resolution at high pulse rates
  • Direct transfer of measurement results and status signals to process control system
  • Measuring system controlled by process control system
  • Complete radiation protection in conformity with German regulation for using X-ray(RöV)

Suitable For In-Situ Measurement Through

  • System of protection devices against temperature,electric and magnetic fields, particles, metal vapors, ...
  • High availability thanks to special design and software support
  • Modular structure for optimal adjustment to the measurement task
  • Extensive internal status monitoring system
  • System status archive
  • Internal self-calibration function
  • Field bus interface for integration into the process control system
  • Simple and robust human-to-machine interface (HMI)
  • Main Unit Dimensions: 32" x 24" x 35.5" Tall -- 266 LBS
  • Smaller Unit Dimensions: 19.75" x 19.75" x 10" -- 194 LBS
  • This used inspection system has been inspected and appears to be in good condition but we cannot test it at our facility. Please contact us for a shipping quote, to arrange local pickup, or to schedule a viewing at our facility.

 

Condition:

This used inspection system has been inspected and appears to be in good condition but we cannot test it at our facility. Please contact us for a shipping quote, to arrange local pickup, or to schedule a viewing at our facility.

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