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Sun Electronic Systems EC127 2.7 CF Temperature Test Chamber

$5,000.00
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SKU:
15327
Condition:
Used
Shipping:
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Sun Electronic Systems EC127  2.7 CF Temperature Test Chamber

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Sun Systems EC-127 2.7 Cubic Foot Temperature Test Chamber designed for use with LabVIEW Instrument Driver set

Specifications:
  • Chamber Volume : 2.7 cu ft
  • Test Chamber Dim [In(Cm)] : 20.0 (50.8) W, 12.0 (30.48) H, 19.0 (48.26) D
  • Overall Dim [In(Cm)] : 26.0 (66) W, 30.0 (76.2) H, 36.0 (91.44) D
    Heat Rate of Change:(Empty Chamber)
  • +25C to +100C : 15 minutes
  • +25C to +120C : 21 minutes
  • +25C to +150C : 30 minutes
  • +25C to +200C : 30 minutes

    Cool Rate of Change(Empty Chamber)
  • +25C to +5C : 4 minutes
  • +25C to 0C : 6 minutes
  • +25C to -10C : 11 minutes
  • +25C to -25C : 25 minutes
  • +25C to -30C : 38 minutes

  • Active Load Capacity :100 watts device under test loading at -20C
  • Air Flow (CFM, Vertical) : 300 cu ft / min
  • Power Supply : 110/115 VAC, 15 AMP, 50/60 Hz
  • Power Requirement : 1650 watts
  • Weight; Net / Shipping : 170 lbs (78 Kg)
  • Temperature Setpoint Range : -30 Deg C to +200 Deg C
  • Time at Temperature Range : 1.0 sec to 99 hrs 59 min 59 sec or continuous
  • Temperature Ramping Rate Control : Locally controlled from 0.01 Deg C / min up to the specified rate of change
  • Programmable Set Temps and Times : Number of set temperatures and times only limited by available program memory, typically 100+ seg Absolute Error (not including probe error) : +/- 0.25 Deg C
  • Long Term Stability (per month) : +/- 0.2 Deg C
  • Temperature Resolution : 0.02 Deg C
  • Line Voltage Sensitivity (105-125 VAC) : +/- 0.1 Deg C
  • Programmable Temperature Loop Control : 1 to 65535 FOR/NEXT loop executions for 10 loops, Nesting supported
  • Temperature Control Technique : PID Algorithm / Pulse Width Modulated, Programmable

    This item powers up, responds to programming, heats up, and cools down. This item tested OK and is being sold as is with no warranty. No manual or peripherals are included.
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