Das Device P00393 Gold Wire Probe Card Electroglas Wafer Testing Gold Contact

Das Device P00393 Gold Wire Probe Card Electroglas Wafer Testing Gold Contact

The Das Device P00393 is a gold wire probe card designed for wafer-level semiconductor testing, compatible with Electroglas wafer prober systems. The card uses a circular array of fine gold wire needles to make simultaneous electrical contact with die pads on a semiconductor wafer, enabling parametric and functional testing during the wafer sort process before individual die are singulated and packaged.

Specifications & What's Included

• Part Number: P00393
• Revision / Lot Code: B704
• Manufacture Date: January 1999 (1/99 J per label)
• Probe Technology: Gold wire needle array
• Contact Material: Gold
• Probe Configuration: Circular radial needle layout targeting a central die contact area
• PCB Substrate: Yellow laminate board with etched spiral signal traces
• Lower Interface: Comb-style contact finger strip for prober interface
• Connectors: Gold-plated coaxial-style contacts on lower mounting bar (2 visible)
• Mounting Bar: Metal bar with gold-plated threaded studs for prober chuck registration
• Compatible With: Electroglas wafer prober platforms
• Probe card only — no cables or accessories included

Applications

Probe cards are the critical interface between a wafer prober and the semiconductor die under test. During wafer sort, the probe card is loaded into the prober's chuck assembly and each die on the wafer is stepped under the needle array; the probes contact the die's bond pads and the tester applies signals to evaluate electrical functionality before packaging. Gold wire probe cards like the P00393 were widely used in production IC test environments from the 1980s through the 2000s, particularly for analog, mixed-signal, and RF device testing where gold's low contact resistance and corrosion immunity were important. The Electroglas prober platform — one of the dominant wafer prober families in production fabs during this era — used standardized probe card mounting interfaces that cards like this one were designed to fit. Replacement and spare probe cards remain in demand for legacy production lines and failure analysis labs still operating older Electroglas systems.