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Gaertner Scientific L117 Manual Null Ellipsometer w/ Rudolph 432A3

$2,500.00
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SKU:
12266
Gaertner Scientific L117  Manual Null Ellipsometer w/ Rudolph 432A3

Out of stock

  • Manual Null Ellipsometer
  • Includes Rudolph Instruments 432A3
  • Used in the measurement of the thickness and refractive index of very thin transparent films.
  • Ellipsometer can be used to measure the thickness (range of 2 -200 nm) and refractive index of dielectric films.

    This item is brand new in a brown box. It comes only with the peripherals shown in the photos.